Compare Model Drawings, CAD & Specs Availability Price
Laser Diode Driver, High Power CW/QCW, 18A, 35V, GPIB (RoHS and / or CE Pending)
5 Weeks
5 Weeks
Laser Diode Driver, High Power CW/QCW, 25A, 12V, GPIB (RoHS and / or CE Pending)
In Stock
In Stock
Laser Diode Driver, High Power CW/QCW, 40A, 30V, GPIB (RoHS and / or CE Pending)
3 Weeks
3 Weeks
Laser Diode Driver, High Power CW/QCW, 50A, 12V, GPIB (RoHS and / or CE Pending)
3 Weeks
3 Weeks
Laser Diode Driver, High Power CW/QCW, 70A, 30V, GPIB (RoHS and / or CE Pending)
6 Weeks
6 Weeks
Laser Diode Driver, High Power CW/QCW, 125A, 24V, GPIB (RoHS and / or CE Pending)
In Stock
In Stock


  • Computer Interfaces
  • Laser Current Resolution
    10 mA
  • Laser Current Accuracy
  • Current Output 1 h Stability
    <100 ppm FS
  • Duty Cycle
    0.5 to 90%
  • Pulse Width
    40 µs to 2s
  • Pulse Repetition Rate
    0.1 Hz - 1 kHz
  • Temperature Monitor
  • Photodiode Measurement
  • Laser Safety
    Intermittent contact protection; adjustable forward voltage limit, on / off shorting semiconductor switch, slow start circuit; floating output, independent adjustable current limit, power line surge and EFT transient protection
  • Display Type
    Dual 5-digit Green LED


High Power Precision Laser Diode Testing

Each LDX-36000 Series Laser Diode Driver was designed as a current source specifically for high power laser diodes. Ideal for R&D or manufacturing testing, precision low noise current control with set point accuracy of 0.1% of reading is delivered to the lasers, with four-wire voltage measurement and a photodiode monitor with adjustable reverse bias for CW and QCW LIV testing, laser qualification testing, or pulse testing.

Precision Pulse Control for High Power Laser Testing

The LDX-36000 Series offer several QCW operating modes delivering clean pulses with low overshoot and fast rise and fall times. Digital control of pulse width, duty cycle and frequency provide quick and easy control of pulse parameters for maximum flexibility in varying test applications. The pulsed output can be generated in one of three modes; internal pulse, hard pulse, and triggered pulse. If the LDX-36000 is being used in diode-pumped solid state laser and amplifier testing, programmable input and output trigger delays allow for optimizing Q-switch timing and energy extraction without the need for any external delay generators.

Choice of Laser Current Control Modes

Each LDX-36000 can be operated at full scale current and voltage in CW or QCW mode saving time and reducing cost of test by eliminating multiple instruments and test set-ups. Conduct CW L-I-V testing and pulse testing of high power laser diodes all at the same test station, without moving the laser or changing the output cable. With the 36000’s there is no need for another QCW instrument, simply change operating modes from the front panel or through the GPIB interface, set up the test parameters and start testing quickly in either mode. In QCW mode, the pulse output can be generated either internally with programmable pulse width, duty cycle and frequency parameters or through an external pulse trigger. For some applications, long pulse widths are required during testing. All 36000 models offer a "hard" pulse mode where the pulse width can be adjusted from 1 ms to 2 seconds with a duty cycle up to 90%. Additionally, a unique power display mode allows laser diode power to be set based on programmable slope efficiency and threshold current parameters.

Setting the Standard in Laser Diode Protection

Laser diodes are extremely sensitive to electro-static discharge, excessive current levels, current spikes, or transients from power surges or other laboratory equipment. One of the most important features we have implemented into each instrument is the ILX Lightwave proven laser diode protection standards. These standards have led to advanced protection features such as current and voltage limits, a slow-start ramping technique, floating outputs, fast error detection, and immunity to operational and power line transients. Careful attention to design has resulted in minimal overshoot in QCW mode or while rapidly stepping current in CW mode at any output current level. In case of a device failure with multiple devices connected in series, low overshoot and closed-loop power supply control ensure the safety of the remaining devices. A temperature monitor provides additional protection with a programmable temperature limit which disables the current source output in a limit condition. For more information about these protection features, please see our “Protecting Your Laser Diode" application note.

Automate High Power Laser Testing

Remote instrument operation is available on all of the LDX-36000 Series High Power Drivers through an IEEE488/GPIB interface. All instrument controls and functions are accessible through the interface for easy remote programming and control in automated test systems where repeatable and accurate test sequencing, measurements, and data handling are required. Whether the application is data intensive L-I-V testing, pulsed control for thermal characterization, or R&D evaluations, remote operation of the LDX-36000’s saves time and ensures systematic data collection and instrument operation.

Precision L-I-V Testing

Each LDX-36000 Series Laser Diode Driver was developed specifically for precision L-I-V testing of high power laser diodes with 0.1% set point accuracy, low noise and precision forward voltage measurement capability in CW or QCW pulsed modes. Additionally, the instrument can perform power measurements through an independent photo-diode input calibrated with a user-programmable responsivity. An adjustable 0 to -15V reverse bias ensures linear measurements and fast conversion speed. Accurate forward voltage measurements even with high current and long cable lengths are accomplished real time through a four wire measurement system. Reduce total system cost with these high current drivers; there is no need for separate pulsed sources, voltage measuring instruments, or low current measuring instruments for high power L-I-V. testing.

Ease of Operation

Designed for ease of use and readability, the front panel features dual 7-segment LED displays with instrument controls grouped by mode and function. The dual display lets you view laser parameters simultaneously with the bright 7-segment LED display highly visible from a distance in darkened labs. Parameters such as output current setpoint, current and voltage limits and calibration constants are easily selected and adjusted with the rotary digital encoder. Each display is easily configured to indicate laser parameters such as current, voltage, power, and temperature with discrete control push buttons located below each display. System errors such as open circuits and current or voltage limits are indicated with discrete LED’s with an error code indicated on the appropriate seven-segment LED display.

Save and Recall Instrument Settings

For multiple instrument test configurations, the LDX-36000 Series Laser Diode Drivers offer a SAVE and RECALL feature. The SAVE function allows you to store all the front panel settings for any given instrument configuration to a numbered bin. The RECALL function allows you to retrieve any of the saved configurations at any time through simple front panel button presses or remotely through the GPIB interface. This saves time in instrument re-configuration for different manufacturing runs or R&D experiments.