Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/20, 440-700 nm

The 20Q40NC.1 Broadband Beam Sampler is a 2.0 inch (50.8 mm) diameter, 9.40 mm thick, UV fused silica beam sampler with a λ/20 surface flatness. It is 440-700 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.
Specifications
- Wavelength Range440-700 nm
- Diameter50.8 mm
- MaterialUV Grade Fused Silica
- Antireflection CoatingNC.1
- Angle of Incidence45°
- Damage Threshold500 W/cm2 CW, 5 J/cm2 for 10 nsec pulses, typical @ 532 nm
- Surface Flatness≤λ/20 at 632.8 nm over the clear aperture
- Surface Quality10-2 scratch-dig
- Diameter Tolerance+0/-0.13 mm
- Thickness9.4 mm
- Thickness Tolerance±0.38 mm
- Wedge30 ±15 arc min
- Clear Aperture> central 80% of diameter
- Chamfers0.38-1.14 mm face width
- Chamfers Angle Tolerance45° ±15°
- DurabilityMIL-C-675C, moderate abrasion million cycles
- Cleaning
- Substrate Number20Q40
Resources & Downloads
Other
20Q40NC.1 RoHS Certificate(704.8 kB, PDF) NC.1 Raw Data.xlsx(66.1 kB, XLSX)
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