The Centurion Series Laser Diode Limited Monitoring Burn-In System offers ILX Lightwave® proven device protection, temperature control, and measurement technology for laser diodes, optimized for cost effectiveness and performance for lifetime testing, all within our industry leading test platform.  With the inclusion of our Integrated Carrier Solution (ICS), individual device handling is limited during multiple test cycles, compatible with automated component placement equipment. Customization of the ICS carrier broadens the utility of the Centurion system for future device expansion.

When combined with the complementary Salus LCS-9408 Laser Diode Characterization test system, laser diodes can be characterized by the Salus system in a pre-burn in scenario, then sent to the Centurion system for specific burn-in cycles with voltage monitoring during the process. A secondary post-burn in characterization is then performed by the LCS-9408 system, to check for degredation and device validation based upon the historical data. The tested devices travel on the ICS carrier, eliminating individual device handling requirements during the full qualification process.