The Salus Series Laser Diode Characterization Test System combines ILX Lightwave® proven device protection, temperature control, and measurement technology for laser diodes, with Newport’s industry leading motion control technology, for an innovative and efficient laser characterization system.  Through the use of motion stages and the ILX Lightwave® high accuracy FMH-8715 measurement head, individual laser diode emissions are aligned for electrical (LIV) data, as well as a separate fiber pick off alignment for an Optical Spectrum Analyzer (OSA) measurement, for center wavelength and SMSR data collection.  With the inclusion of our Integrated Carrier Solution (ICS), individual device handling is limited during multiple test cycles, compatible with automated component placement equipment.

When combined with the complementary Centurion LMS-9406 Limited Monitoring Burn-In test system, laser diodes can be characterized by the Salus system in a pre-burn in scenario, then sent to the Centurion system for specific burn-in cycles with voltage monitoring during the process.  A secondary post-burn in characterization is then performed by the LCS-9408 system, to check for degredation and device validation based upon the historical data.  The tested devices travel on the ICS carrier, eliminating individual device handling requirements during the full qualification process.