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Laser Diode Characterization System, Salus Series, Up to 500 mA


Optimized Device Population and Handling

Through the use of our Integrated Carrier Solution (ICS), ILX Lightwave® has designed an optimized device handling solution, with up to 32 device capacity.  The ICS is separated into two parts:  the lower section is the Device Under Test (DUT) Guide Plate for individual device population (either through an automated or manual process), while the top clamp section is for securing the devices, applying proper thermal and electrical contact.  Once fully populated and secured, the compact ICS is transferred to either the Salus Laser Diode Characterization system, or to the complementary Centurion Limited Monitoring Burn-In system.  Multiple test cycles can be performed with an efficient transfer system, eliminating individual device handling requirements during the test device qualification.

Safe for the Laser and the Operator

  • Utilizes ILX Lightwave laser diode protections
  • Minimizes operational transients and reduces transients from power line burst and surge
  • Uniform and repeatable thermal control
  • Fault monitoring