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Z-Scan Kit, Characterization of Transparent Optical Materials, Metric
Z-Scan Kit, Characterization of Transparent Optical Materials


Characterize Non-linear Properties of Optical Materials

Reliable methods for determining the nonlinear optical properties of materials have been developed for wide ranging applications such as optical limiting, multi-photon polymerization, and optical switching. Of these methods, the "z-scan", introduced in 1985 and later developed by Eric Van Stryland remains the standard technique. The z-scan technique is performed by translating a sample through the beam waist of a focused beam and then measuring the power transmitted through the sample. Z-scan has many possible configurations (e.g. "EZ-Scan", "White Light z-scan", "Excite-Probe z-scan"). The two measurable quantities connected with the z-scan are nonlinear absorption (NLA) and nonlinear refraction (NLR). These parameters are associated with the imaginary and real part of the third order nonlinear susceptibility, and provide important information about the properties of the material.

Reference Software

The software included with this product is for reference only. It has been tested in the experimental setup described in the application note. The software will need to be customized by the user for additional experimental requirements. At the present time, Newport provides limited support for this software and any concern should be discussed with Newport before purchasing the product. Please contact Newport Sales for further details.

Application Note

Please see Application Note 34 for more information on the Z-scan technique.