Sorry, this product is no longer offered for sale. It was discontinued on Aug 11, 2020
Laser Diode Burn In System, 0-2 Amp Diodes

The LRS-9434 system platform is an air cooled, rack based system that leverages the ILX Lightwave® industry leading technology to provide customers with the next level of performance for life-test, burn-in, and qualification testing. With additional capacity up to 1408 devices in the LRS-9434 modular rack, the user will be able to increase throughput and lower the overall cost of test.
The LRS-9434's proven laser control technology gives the flexibility to process TO-Can lasers, TOSA assemblies, butterfly, and proprietary package styles in the same system. The LRS-9434 incorporates precise, individual fixture control allowing the user to run up to 44 independent tests, each at a unique temperature in the range of 25°C to 150°C. Careful attention to thermal management, high accuracy control and measurement circuitry, and multiple levels of laser protection deliver long term stability to ensure data continuity even through power disruptions.
The LRS-9434 includes the latest ReliaTest system graphical user interface supervisory software. Standard control modes support ACC, APC, and LIV tests, which are easily configured using the system's control software. Multiple device types and test scenarios are easily configured without complicated programming. In addition, careful attention to data management and fault mode handling ensures data integrity even through power blackouts.
ILX Lightwave also offers a stand-alone calibration fixture and software package, ReliaCal, to provide on-site calibration at any desired interval on the LRS-9434 system. Click here for more information.
Resources & Downloads
Manuals
LRS-9434 Test System User's Manual(5.6 MB, PDF) ReliaCal User's Guide(755.9 kB, PDF)
Literature
9434 Brochure(440.1 kB, PDF) Telecom Data Brochure(4.9 MB, PDF) ILX Test Systems Comparison Chart(729.6 kB, PDF)
Application Notes
Laser Diode BurnIn and Reliability Testing(788.2 kB, PDF) ReliaTest LI Threshold Calculations(390.1 kB, PDF) Differences Between Threshold Current Calculations(1.5 MB, PDF) Accelerated Aging Test of 1310 nm Laser Diodes(348.5 kB, PDF) Estimating Laser Diode Lifetimes and Activation Energy(346.9 kB, PDF)
Technical Notes
LRS-9400 Series External Photodiode Array Calibration(56.6 kB, PDF) LRS-9434 Temperature Set Point Accuracy(2.9 MB, PDF) LRS-9434 Temperature Coefficient(724.1 kB, PDF) LRS-9434 and LMS-9406 Transient Protection(1.9 MB, PDF) Protecting Your Laser Diode(2.3 MB, PDF) LRS-9434 Threshold Current Measurement Repeatability(4.4 MB, PDF) Improve Throughput and Maintain Performance with the ILX Integrated Carrier Solution(1.3 MB, PDF)
Software
Laser Reliability Workbook 1.01(193.9 kB, ZIP)



