Quantum Efficiency Measurement System, 350-1100 nm Wavelength Range

  • Detector Type
    Silicon, large area
  • Polarization
    2:1 linear, S-polarized (at sample)
  • Flange Series Size
    1.5 In.
  • Lamp Type
    100W Xenon
  • Wavelength Range
    350-1100 nm
  • Spot Size
    0.80 x 1.0 +0.1/-0.0 mm
  • Working Distance
    74 ±1 mm  
  • Bandwidth
    1-40 nm (FWHM)
  • Wavelength Accuracy
    ± 0.5 nm
  • Measurement Type
    Chopped beam AC measurement with virtual lock-in amplifier
  • Current Range
    10 nA - 1.0 A
  • Voltage Range
    ±10 V (measurement)
  • Voltage Resolution
    0.1 V (bias)
  • Bias Voltage
    ±10 V up to 0.5 A
  • Resolution
    0.1 Hz (for 4-100 Hz chopper frequency)
  • Gain
    Sample DC Settings: 10, 100, 1k, 10k, 100k, 1M, 10M
    AC Settings: 1, 10, 100, 1000
  • Operating Temperature Range
    23 ±5 °C
  • Storage Temperature Range
    -40 to +70 °C
  • Operating Humidity
    <85% relative, non-condensing
  • Operating Mode
    Constant Current or Constant Power
  • Power Requirements
    100-115 VAC, 3 A, 48-66 Hz
    220-240 VAC, 1.5 A, 48-66 Hz
  • Dimensions
    0.54 x 0.85 x 0.40 m
    (21.1 x 33.4 x 14.6 in.)
  • Weight
    31.8 kg (70 lbs)