Quantum Efficiency Measurement System, 325-1800 nm Wavelength Range

  • Detector Type
    Patented summed Si/Ge bounce
  • Polarization
    2:1 linear, S-polarized (at sample)
  • Lamp Type
    100W Xenon
  • Wavelength Range
    325-1800 nm
  • Spot Size
    1.1 x 1.2 ±0.1 mm at focus
  • Working Distance
    85 ±1 mm
  • Bandwidth
    1-40 nm (FWHM)
  • Wavelength Accuracy
    ±0.5 nm
  • Measurement Type
    Chopped beam AC measurement with virtual lock-in amplifier
  • Current Range
    10 nA - 1.0 A
  • Voltage Range
    ± 10V (measurement)
  • Voltage Resolution
    0.1 V (bias)
  • Bias Voltage
    ±10 V up to 0.5 A
  • Resolution
    0.1 Hz (for 4-100 Hz chopper frequency)
  • Gain
    Sample DC Settings: 10, 100, 1k, 10k, 100k, 1M, 10M
    AC Settings: 1, 10, 100, 1000
  • Operating Temperature Range
    23 ±5 °C
  • Storage Temperature Range
    -40 to +70 °C
  • Operating Humidity
    <85% relative, non-condensing
  • Power Requirements
    100-115 VAC, 3 A, 48-66 Hz
    220-240 VAC, 1.5 A, 48-66 Hz
  • Dimensions
    0.54 x 0.85 x 0.40 m
    (21.1 x 33.4 x 14.6 in.)
  • Weight
    31.8 kg (70 lbs)