Z-Scan Kit, Characterization of Transparent Optical Materials, Metric

The M-Z-SCAN Characterization of Transparent Optical Materials Kit is a simple implementation of the z-scan technique that can be used to characterize relatively thin (< 5mm) optical materials. All of the optics and mounts in this kit have been certified by our Ph.D. scientists in the Newport Technology and Applications Center to work together and be compatible with the Spitfire XP Pro. A much more detailed explanation of this kit, alignment procedures, recommended operating parameters found in Newport Application Note 34, Z-Scan for the Characterization of Transparent Optical Material. Reliable methods for determining the nonlinear optical properties of materials have been developed for wide ranging applications such as optical limiting, multi-photon polymerization as well as optical switching. Of these methods, the z-scan, introduced in 1985 and later developed by Eric Van Stryland remains the standard technique. The technique is performed by translating a sample through the beam waist of a focused beam and then measuring the power transmitted through the sample. Z-scan has many possible configurations including EZ-Scan, White Light z-scan, Excite-and Probe z-scan. Standard open aperture and closed aperture z-scan are covered with the kit. The two measurable quantities connected with the z-scan are nonlinear absorption (NLA) and nonlinear refraction (NLR). These parameters are associated with the imaginary and real part of the third order nonlinear susceptibility, and provide important information about the properties of the material. Metric version.