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UV Broadband Beam Sampler, UVFS, 25.4 mm, λ/10, 255-440 nm
UV Broadband Beam Sampler, UVFS, 25.4 mm, λ/10, 255-440 nm
Model: 10Q20NC.UV
Product Series Overview
Broadband Beam SamplersThe 10Q20NC.UV Broadband Beam Sampler is a 1.0 inch (25.4 mm) diameter, 6.10 mm thick, UV fused silica beam sampler with a λ/10 surface flatness. It is 255-440 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.
Specifications
- Wavelength Range255-440 nm
- Diameter25.4 mm
- MaterialUV Grade Fused Silica
- Antireflection CoatingNC.UV (Ravg < 1% @ 255-440 nm)
- Angle of Incidence45°
- Damage Threshold1.0 J/cm2 with 10 nsec pulses, 10 Hz @ 266 nm, typical
- Surface Flatness≤λ/10 at 632.8 nm over the clear aperture
- Surface Quality15-5 scratch-dig
- Diameter Tolerance+0/-0.13 mm
- Thickness6.1 mm
- Thickness Tolerance±0.38 mm
- Wedge30 ±15 arc min
- Clear Aperture> central 80% of diameter
- Chamfers0.25-0.76 mm face width
- Chamfers Angle Tolerance45° ±15°
- DurabilityMIL-C-675C, adhesion, abrasion and solubility
- Cleaning
- Substrate Number10Q20
Resources & Downloads
Other
10Q20NC.UV RoHS Certificate(265.3 kB, PDF) 10Q20NC.UV_ROHS2-2021.pdf(279.6 kB, PDF)
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| Compare | Description | Drawings, CAD & Specs | Avail. | Price | ||
|---|---|---|---|---|---|---|
 | 20Q20NC.UVUV Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 255-440 nm |