Broadband Beam Samplers

Compare	Model	Compatibility	rankScore	ranking	Diameter	Wavelength Range	Material	Surface Quality	Availability	Price	Brand
10B20NC.1 Optical Beam Sampler, Broadband, N-BK7, 25.4 mm, λ/10, 440-700 nm $112 In Stock	10B20NC.1 Optical Beam Sampler, Broadband, N-BK7, 25.4 mm, λ/10, 440-700 nm	UNIVERSAL	-1.0		25.4 mm	440-700 nm	Grade A N-BK7	15-5 scratch-dig	In Stock	$112	Newport
10B20NC.2 Optical Beam Sampler, Broadband, N-BK7, 25.4 mm, λ/10, 660-1000 nm $124 In Stock	10B20NC.2 Optical Beam Sampler, Broadband, N-BK7, 25.4 mm, λ/10, 660-1000 nm	UNIVERSAL	-1.0		25.4 mm	660-1000 nm	Grade A N-BK7	15-5 scratch-dig	In Stock	$124	Newport
10B20NC.3 Optical Beam Sampler, Broadband, N-BK7, 25.4 mm, λ/10, 1010-1550 nm $135 In Stock	10B20NC.3 Optical Beam Sampler, Broadband, N-BK7, 25.4 mm, λ/10, 1010-1550 nm	UNIVERSAL	-1.0		25.4 mm	1010-1550 nm	Grade A N-BK7	15-5 scratch-dig	In Stock	$135	Newport
10Q20NC.1 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/10, 440-700 nm $130 In Stock	10Q20NC.1 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/10, 440-700 nm	UNIVERSAL	-1.0		25.4 mm	440-700 nm	UV Grade Fused Silica	15-5 scratch-dig	In Stock	$130	Newport
10Q20NC.2 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/10, 660-1000 nm $141 In Stock	10Q20NC.2 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/10, 660-1000 nm	UNIVERSAL	-1.0		25.4 mm	660-1000 nm	UV Grade Fused Silica	15-5 scratch-dig	In Stock	$141	Newport
10Q20NC.3 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/10, 1010-1550 nm $151 In Stock	10Q20NC.3 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/10, 1010-1550 nm	UNIVERSAL	-1.0		25.4 mm	1010-1550 nm	UV Grade Fused Silica	15-5 scratch-dig	In Stock	$151	Newport
10Q20NC.UV UV Broadband Beam Sampler, UVFS, 25.4 mm, λ/10, 255-440 nm $201 2 Weeks	10Q20NC.UV UV Broadband Beam Sampler, UVFS, 25.4 mm, λ/10, 255-440 nm	UNIVERSAL	434.2383	0.028056667	25.4 mm	255-440 nm	UV Grade Fused Silica	15-5 scratch-dig	2 Weeks	$201	Newport
10Q40NC.1 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/20, 440-700 nm $306 In Stock	10Q40NC.1 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/20, 440-700 nm	UNIVERSAL	-1.0		25.4 mm	440-700 nm	UV Grade Fused Silica	10-2 scratch-dig	In Stock	$306	Newport
10Q40NC.2 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/20, 660-1000 nm $317 In Stock	10Q40NC.2 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/20, 660-1000 nm	UNIVERSAL	-1.0		25.4 mm	660-1000 nm	UV Grade Fused Silica	10-2 scratch-dig	In Stock	$317	Newport
10Q40NC.3 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/20, 1010-1550 nm $333 In Stock	10Q40NC.3 Optical Beam Sampler, Broadband, UVFS, 25.4 mm, λ/20, 1010-1550 nm	UNIVERSAL	-1.0		25.4 mm	1010-1550 nm	UV Grade Fused Silica	10-2 scratch-dig	In Stock	$333	Newport
20B20NC.1 Optical Beam Sampler, Broadband, N-BK7, 50.8 mm, λ/10, 440-700 nm $224 In Stock	20B20NC.1 Optical Beam Sampler, Broadband, N-BK7, 50.8 mm, λ/10, 440-700 nm	UNIVERSAL	-1.0		50.8 mm	440-700 nm	Grade A N-BK7	15-5 scratch-dig	In Stock	$224	Newport
20B20NC.2 Optical Beam Sampler, Broadband, N-BK7, 50.8 mm, λ/10, 660-1000 nm $253 In Stock	20B20NC.2 Optical Beam Sampler, Broadband, N-BK7, 50.8 mm, λ/10, 660-1000 nm	UNIVERSAL	-1.0		50.8 mm	660-1000 nm	Grade A N-BK7	15-5 scratch-dig	In Stock	$253	Newport
20B20NC.3 Optical Beam Sampler, Broadband, N-BK7, 50.8 mm, λ/10, 1010-1550 nm $279 In Stock	20B20NC.3 Optical Beam Sampler, Broadband, N-BK7, 50.8 mm, λ/10, 1010-1550 nm	UNIVERSAL	-1.0		50.8 mm	1010-1550 nm	Grade A N-BK7	15-5 scratch-dig	In Stock	$279	Newport
20Q20NC.1 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/10, 440-700 nm $302 In Stock	20Q20NC.1 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/10, 440-700 nm	UNIVERSAL	-1.0		50.8 mm	440-700 nm	UV Grade Fused Silica	15-5 scratch-dig	In Stock	$302	Newport
20Q20NC.2 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/10, 660-1000 nm $318 In Stock	20Q20NC.2 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/10, 660-1000 nm	UNIVERSAL	-1.0		50.8 mm	660-1000 nm	UV Grade Fused Silica	15-5 scratch-dig	In Stock	$318	Newport
20Q20NC.3 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/10, 1010-1550 nm $333 In Stock	20Q20NC.3 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/10, 1010-1550 nm	UNIVERSAL	-1.0		50.8 mm	1010-1550 nm	UV Grade Fused Silica	15-5 scratch-dig	In Stock	$333	Newport
20Q20NC.UV UV Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 255-440 nm $412 2 Weeks	20Q20NC.UV UV Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 255-440 nm	UNIVERSAL	434.2383	0.017345	50.8 mm	255-440 nm	UV Grade Fused Silica	15-5 scratch-dig	2 Weeks	$412	Newport
20Q40NC.1 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/20, 440-700 nm $488 In Stock	20Q40NC.1 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/20, 440-700 nm	UNIVERSAL	-1.0		50.8 mm	440-700 nm	UV Grade Fused Silica	10-2 scratch-dig	In Stock	$488	Newport
20Q40NC.2 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/20, 660-1000 nm $501 In Stock	20Q40NC.2 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/20, 660-1000 nm	UNIVERSAL	-1.0		50.8 mm	660-1000 nm	UV Grade Fused Silica	10-2 scratch-dig	In Stock	$501	Newport
20Q40NC.3 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/20, 1010-1550 nm $515 In Stock	20Q40NC.3 Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/20, 1010-1550 nm	UNIVERSAL	-1.0		50.8 mm	1010-1550 nm	UV Grade Fused Silica	10-2 scratch-dig	In Stock	$515	Newport
5801 Beam Pick-Off Optic, 1.0 in. Diameter, N-BK7 $144 In Stock	5801 Beam Pick-Off Optic, 1.0 in. Diameter, N-BK7	UNIVERSAL	-1.0		25.4 mm	350-2000 nm	Grade A N-BK7	20-10 scratch-dig	In Stock	$144	New Focus
5802 Beam Pick-Off Optic, 2.0 in. Diameter, N-BK7 $235 In Stock	5802 Beam Pick-Off Optic, 2.0 in. Diameter, N-BK7	UNIVERSAL	-1.0		50.8 mm	350-2000 nm	Grade A N-BK7	20-10 scratch-dig	In Stock	$235	New Focus

Features

Fresnel Reflection

A material that exhibits birefringence, or different refractive indices for different input polarizations, is said to be anisotropic. This anisotropy affects the transmission and absorption properties of light and is the primary mechanism used in polarizers and waveplates. However, even isotropic materials (same index for different polarizations) can enable polarization selection via reflection. For a linearly polarized beam, both S- and P-polarizations exhibit different changes in reflectivity versus incident angle. There is an incident angle known as Brewster’s angle (θ_B) at which P-polarized light is transmitted without loss, or exhibits zero reflectance, while S-polarized light is partially reflected. This angle can be determined from Snell’s law to be θ_B = arctan(n₂/n₁). The accompanying figure shows this response when light is incident from air onto a dielectric material where θ_B ≈ 56°.

Broadband Beam Samplers

In a beam sampler, the percentage of reflected light is determined by the Fresnel reflection from a single surface. By reflecting approximately 10% of S-polarization and 1% of P-polarization at the nominal 45° AOI, the beam sampler picks off 1-10% of an incident beam, depending on its polarization upon incidence. Reflectance from a single uncoated surface for both S- and P- polarizations is shown here. The graph exhibits reflectance of the plate as a function of incident angle, showing the minimum in the P-polarization at Brewster’s angle, 55° 34’.

N-BK7 Substrates for VIS and NIR Applications

N-BK7 is an excellent lens material for general use such as most visible and near infrared applications. It is the most common borosilicate crown optical glass, and it provides great performance at a good value. Its high homogeneity, low bubble and inclusion content, and straightforward manufacturability make it a good choice for transmissive optics.

UV Fused Silica for UV & Broadband Applications

UV Grade Fused Silica is synthetic amorphous silicon dioxide of extremely high purity providing maximum transmission from 195 to 2100 nm. This non-crystalline, colorless silica glass combines a very low thermal expansion coefficient with good optical qualities, and excellent transmittance in the ultraviolet region. Transmission and homogeneity exceed those of crystalline quartz without the problems of orientation and temperature instability inherent in the crystalline form. It will not fluoresce under UV light and is resistant to radiation. For high-energy applications, the extreme purity of fused silica eliminates microscopic defect sites that could lead to laser damage.

Slight Wedge Suppresses Unwanted Fringes

Optics with perfectly parallel faces are unsuited for use as reference elements in laser setups as reflections from both surfaces would be collinear resulting in undesired large period fringes. The introduction of a slight wedge causes unwanted reflections from the second surface to be deflected from the optical path. The back surface (S₂) of these beam samplers is slightly wedged. The laser beam should enter the non-wedged surface (S₁) where an arrow on the side points to.

AR Coated Back Surface Eliminates Ghosting

An antireflection coating of high damage threshold (500 W/cm² CW, 1.0 J/cm² with 10 nsec pulses, typical) is applied on the back surface (S2) to minimize ghost reflections. Four broadband AR coatings are offered and optimized for 45° angle of incidence beams with <0.75% reflectance. NC.1 covers the 440-700 nm spectral range, NC.2 covers the 660-1000 nm spectral range, NC.3 covers the 1010-1550 nm spectral range and NC.UV covers the 255-440 nm spectral range. Uncoated version is also available, used as beam pick-off optics, to monitor the laser beam, independent of wavelength.

Laser Cavity Applications

Polarization-selective reflectivity is exploited in laser cavities to produce strongly polarized light, as well as for fine tuning of the output laser wavelength. A Brewster’s window is used in the laser cavity, providing polarized light output with minimal power loss. It follows the formula θ_B = arctan(n), where θ_B is Brewster’s angle and n is the index of refraction of the material. Often, fixed beam polarization is necessary in order that optical components can consistently perform as they were designed.

Power Measurement Applications

A common application for beam samplers is picking off a portion of a beam in order to track changes in beam power vs time using a detector. This information may be used as part of a feedback loop to regulate power, or could simply be used to log power in order to normalize experimental results at a later time. For measuring beam power, the beam sampler should be oriented such that the laser is p-polarized. This choice will maximize transmitted power and attenuate power incident on the detector.

Broadband Beam Samplers

Broadband Beam Samplers

Overview

Products

Specifications