The Oriel Uniformity Management Tool has been designed to allow the user to accurately measure the uniformity of the irradiance at the test plane of a Solar Simulator. The system incorporates a test platen designed to positively position an appropriate test head in 64 equally spaced positions as defined by IEC method 60904-9, or in 17 predetermined positions as defined by JIS standard C8912. A detector head is provided that is appropriately masked to the area defined by either the IEC method or JIS method, depending on the model purchased. A data acquisition box interfaces with a PC via a USB connection which powers the system without need for any external power supply. Data is acquired using the MUMS software package which prompts the user to position the detector in the appropriate position and provides real-time readout of the Class Uniformity obtained as each datapoint is measured. The software also provides a survey mode which avaerages fewer points and can be used to assist in lamp alignment. Models are available for 2x2, 4x4, 6x6, and 8x8 simulators. The software/data interface box kit and head/platen kit are sold separately. The software/data interface kit can be used for any size simulator. The detector/platen kits are specific to the size simulator illumination area being measured.
