The 918 Series Low-Power Detectors are obsolete. Upon depletion of the remaining stock, the products will no longer be available. Since the 918 Series detectors are not compatible with Newport''s current optical power meter models, we encourage the customer to contact Newport technical support at tech@newport.com or 1-800-222-6440 for recommendations for the most suitable replacement power meter and detector pair.
Compatible Power Meters
- 1930-C and 2930-C (obsolete)
Specifications
|
Detector Model |
918-UV
|
918-SL
|
918-IR
|
918-IG
|
| Wavelength (nm) |
2001100 |
4001100 |
7801800 |
8001650 |
| Power Density, Average Max w/ Attenuator (W/cm2)(1) |
0.2 |
2 |
2 |
2 |
| Power Density, Average Maximum w/o Attenuator (mW/cm2)(1) |
0.2 |
2 |
3 |
3 |
| Pulse Energy Density, Maximum - w/ Attenuator (µJ/cm2)(2) |
0.10 |
1 |
0.35 |
0.35 |
| Pulse Energy, Maximum - w/o Attenuator (nJ/cm2)(2) |
0.1 |
1 |
0.35 |
0.35 |
| Calibration Uncertainty(4) |
4% @ 200-219nm, 2% @ 220-349nm, 1% @ 350-949nm, 4% @ 950-1100 |
1% @ 400-940nm, 4% @ 941-1100 |
2% @ 780-910nm, 2% @ 911-1700nm, 4% @ 1701-1800 |
2% @ 800-900nm, 2% @ 901-1650 |
| Calibration Uncertainty, w/ Attenuator(4) |
8% @ 200-219nm, 2% @ 220-349nm, 1% @ 350-949nm, 4% @ 950-1100 nm |
1% @ 400-940nm, 4% @ 941-1100 nm |
5% @ 780-910nm, 2% @ 911-1700nm, 4% @ 1701-1800nm |
5% @ 800-900nm, 2% @ 901-1650 nm |
| Uniformity (%)(3) |
±2 |
| Linearity (%) |
±0.5 |
| Rise Time (µs) |
≤5.9 |
≤2 |
≤2 |
≤2 |
| Shunt Resistance (MΩ) (typ), @-10V |
≥10 |
≥10 |
≥35 (kΩ) |
≥20 |
| Reverse Bias, Maximum (V) |
5 |
3 |
0.25 |
2 |
| NEP (pW/√Hz) |
0.45 |
0.2 |
0.6 |
0.04 |
| Detector Material |
Silicon-UV Enhanced |
Silicon |
Germanium |
Indium Gallium Arsenide |
| Active Area (cm2) |
1 |
0.071 |
| Active Diameter (cm) |
1.13 |
0.3 |
| Attenuator, OD3 |
Built-In |
| Calibration |
Stored Internally |
| Operating Temperature Range |
<70% RH 5°C to 50 |
1) Applies to entire spectral response.
2) 15 ns pulse width.
3) Uniformity specification applies to detector only.
4) Calibration uncertainty can be varied depending on the NIST transfer standard uncertainty variation.